专利名称：METHODS AND APPARATUS FOR TESTING
AND REPAIRING DIGITAL MEMORYCIRCUITS
发明人：Sundar Iyer,Shadab Nazar,Sanjeev Joshi申请号：US14856758申请日：20150917
公开号：US20160005493A1公开日：20160107
专利附图：
摘要：An ActiveTest solution for memory is disclosed which can search for memoryerrors during the operation of a product containing digital memory. The ActiveTest
system tests memory banks that are not being accessed by normal memory users inorder to continually test the memory system in the background. When there is a conflictbetween the ActiveTest system and a memory user, the memory user is generally givenpriority.
申请人：Cisco Technology, Inc.
地址：San Jose CA US
国籍：US
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