Electrical test equipment

专利名称：Electrical test equipment发明人：Jobson, Ian申请号：EP310741.7申请日：191019公开号：EP0366353B1公开日：19931006

摘要：For applying test probes (40) to socket contact elements (92) of a standardelectrical connector (52), a test probe assembly comprises an adaptor (2) carrying thetest probes (40), and latched into a standard electrical connector insulating housing (48)for mating with the electrical connector (52) so that each test probe (40) engages one ofthe contact elements (92) of the connector (52). The adaptor (2) can also be latched tothe housing (72) of the connector (52), with the contact elements (92) absent therefrom,to provide a second form of test probe assembly for mating with the standard insulatinghousing (48) to probe male contact elements when provided in that housing (48). Thusapart from the housing (4) of the adaptor (2) no additional mouldings are needed toprovide for the probing of two different kinds of mating connectors.

申请人：THE WHITAKER CORPORATION

地址：SUITE 450, 4550 NEW LINDEN HILL ROAD; WILMINGTON, DELAWARE 19808

代理机构：Warren, Keith Stanley

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