Systems, methods and computer program for measurin

专利名称：Systems, methods and computer program

for measuring the surface contour of anobject

发明人：Michelle H. Demers,Richard Wulpern,Jeffery

Hurley,John R. Grindon

申请号：US09241708申请日：19990202公开号：US06373963B1公开日：20020416

专利附图：

摘要：Systems methods and computer program products are provided for obtaining a

three-dimensional data set that is representative of a surface of a three-dimensionalobject. A grating pattern, having a sinusoidally varying intensity pattern, is projected ontothe surface of an object. The projected grating pattern is shifted a number of times andtwo-dimensional deformed grating images of an area segment of the object surface arecaptured and stored. A two-dimensional array of optical phase values is then created.Optical phase values in the two-dimensional array are then used to generate a pluralityof three-dimensional data points that represent respective points on the surface of theobject. Each three-dimensional data point is found by locating, for each pixel in thedetector array of pixels, a point on the surface of the object wherein a ray from a

respective pixel passing through a nodal point of a detector lens is intersected by a planeof constant phase from the projected first grating pattern passing through a nodal pointof a projector lens.

申请人：TEXTILE/CLOTHING TECHNOLOGY CORPORATION

代理机构：Myers Bigel Sibley & Sajovec

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