专利名称:Eddy current flaw detection sensor and
method
发明人:Soshi Narishige,Akira Nishimizu,Masahiro
Koike,Yoshiharu Abe,YuuichiNarumi,Hirofumi Ouchi
申请号:US11680857申请日:20070301公开号:US07358721B2公开日:20080415
专利附图:
摘要:An eddy current flaw detection sensor is provided which can detect a
circumferential crack occurring at the deformed portion or peripheral portion thereof ofa heat transfer tube with a high degree of sensitivity. Two excitation coils cause eddycurrent B to flow in the axial direction of a tubular test object A detection coil disposedbetween the excitation coils detects bypass eddy current D which flows in the
circumferential direction of the test object while bypassing a circumferential crack E. Forthis purpose, the coil axes of the excitation coils are directed to the radial direction of thecylindrical protection member and the coil axis of the detection coil is directed to theaxial direction of the protection member
申请人:Soshi Narishige,Akira Nishimizu,Masahiro Koike,Yoshiharu Abe,YuuichiNarumi,Hirofumi Ouchi
地址:Hitachi JP,Tokai JP,Hitachi JP,Hitachi JP,Hitachiohta JP,Hitachi JP
国籍:JP,JP,JP,JP,JP,JP
代理机构:Mattingly, Stanger, Malur & Brundidge, P.C.
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